Semiconductor Fab Optimization: Why Nanoscale Particle Detection is Non-Negotiable for High Yields
The Battle Against Nanoscale Contamination The semiconductor industry is currently navigating the 3nm and 2nm process nodes, where a single particle the size of a virus can ruin a complex integrated circuit. As transistors shrink, the sensitivity requirements for contamination control equipment grow exponentially. In a modern "Fab," the air is recycled and filtered to an extreme degree, but the...
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